Abstract

This paper proposes a method of fault detection in analog circuits which involves various steps, including selection of benchmark circuits, dataset preparation, signal decomposition, model training, and performance analysis. The main aim of this work is to provide solid performance even in noisy environments. Monte Carlo analysis is used to generate a synthetic dataset with 200 runs per fault class by introducing component tolerances and realistic faults. A multi-stage pipeline is proposed; it begins with resampling the signals and normalizing them, and then noise is added at different levels: 5 dB, 10 dB and 20 dB. Feature fusion is performed by combining time-, frequency-, and statistical-domain features. Statistical-domain features are extracted by applying Variational Mode Decomposition (VMD) to split them into four IMF levels, followed by the application of Continuous Wavelet Transform (CWT) for time–frequency-domain analysis. Support Vector Machine (SVM), Random Forest, and Gradient Boosting are used as base-level classification models. A stacking ensemble model is developed which uses Random Forest, Gradient Boosting, and Extra Trees as base learners and Logistic Regression as the meta-learner.

IPC Classification

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