Abstract

Terahertz time-domain spectroscopy (THz-TDS) is a widely used technique for characterizing a broad range of materials in the terahertz frequency region. Conventional THz-TDS requires both reference and sample signals to extract optical parameters such as refractive index and absorption coefficient. Determining optical anisotropy, specifically birefringence and linear dichroism, typically requires separate measurements of the optical parameters of the sample parallel and perpendicular to the terahertz electric field. This process increases measurement time and depends heavily on a stable reference scan. In this work, we present a simple and accurate method to directly obtain birefringence and linear dichroism without the need for a reference measurement. The proposed approach extracts anisotropic parameters solely from the sample signals by analyzing the differential phase delay and amplitude attenuation between orthogonally polarized terahertz electric field components. We validate this method experimentally using optically anisotropic materials such as TiO2 and bamboo samples and confirm that the results agree closely with those from conventional reference-based THz-TDS. This technique offers a practical route to measure the optical anisotropy of materials, particularly in situations where acquiring a reference signal is challenging.

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