Abstract

Triboelectrification has garnered extensive research and application attention; however, certain phenomena remain inadequately explained from a continuum mechanics perspective, particularly the influence of contact force on triboelectrification behavior. Against this backdrop, this study proposes a continuum-mechanics-based quantitative analysis model that incorporates flexoelectricity into triboelectrification, offering an alternative approach to the underlying mechanisms. Subsequently, atomic force microscopy (AFM) is employed to conduct experiments on p-type Si, SiO2 and polyether ether ketone (PEEK). These experiments systematically investigate the influences of contact force and bias voltages on surface potential. Furthermore, both the experimental and numerical simulation results validate the proposed continuum-mechanics-based model to some extent. These findings show how contact force influences triboelectrification through the flexoelectric mechanism, thereby providing a continuum-mechanical understanding of this complex interaction and advancing the field.

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