Archive/Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”
Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”
Changqing Xu, Yi Liu, Yiqiang Chen
15. Juli 2026
en
Abstract
Semiconductor devices and integrated circuits are increasingly deployed in automobiles, avionics, aerospace platforms, radiation-monitoring systems, high-power optoelectronics, and other safety- or mission-critical applications [...]
IPC Classification
B60H01
Keywords
editorialspecialissuehigh-reliabilitysemiconductordevicesintegratedcircuitseditionmicromachinesincreasinglydeployedautomobilesavionicsaerospaceplatformsradiation-monitoringsystemshigh-poweroptoelectronicsothersafety-mission-criticalapplications
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